"We were able to significantly improve our test operations efficiency and first pass yield using the Exensio dashboarding capability”

Dr. Wei-Chung Wang Fairchild Sr. VP of Manufacturing Operations

“We look forward to leveraging the entire Exensio platform with the Exensio-Yield and Exensio-Control modules, to optimize our chip yields and realize its direct positive impact on our profitability.”

Bob Lima Director of Assembly and Test Operations at Peregrine Semiconductor

"The new features and the single platform approach of Exensio are critical for the success of our new product introductions, enabling us to drive our manufacturing process to higher yields, higher efficiency, and help our customers get to market quickly.”

Kevin Haskew Sr VP and CIO at ON Semiconductor

"After benchmarking the current market offers and testing a real implementation of mæstria® in our Reutlingen facility, we drew the conclusion that mæstria® is the best adapted FDC solution to our fabrication environment."

Thorsten Widmer Vice President of Semiconductor Plant at Robert Bosch GmbH

"After an extensive evaluation and actual usage, we found mæstria® and dataPOWER® to be the best stand-alone FDC and YMS products on the market today."

Walter Mente Vice President Operations at austriamicrosystems