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より少ないデータの削減処理
データを収集して整理するのではなく、時間をかけて回答を見つける
Advantest and PDF Solutions Announce First Integrated Product From Joint Partnership
Dynamic Parametric Test Product Now in Use by Major IDM
プレスリリース
データの洞察だけでなく、データFORESIGHTを提供します
Leaders can accurately predict outcomes, long before others even recognize a trend is occurring. Semiconductor manufacturing success in the era of cloud computing and Industry 4.0 requires the ability to integrate data across the entire product lifecycle and apply predictive analytics at the edge to positively impact future outcomes such as yield, quality, and reliability.
