APCSM 2025 (Advanced Process Control – Smart Manufacturing)

We are excited to announce that John Kibarian will be the Keynote at this years APCSM conference in Snow Bird, Utah!

Several other members of our team will also speak at the conference.

September 22

8:00 AM – 12:00 PM: the Tutorials will be presented by PDF Solutions’s Alan Weber, Brian Rubow, and Jon Holt

September 23:

9:15 AM: John Kibarian, “The Evolution of Semiconductor Collaboration”

11:30 AM: Alan Weber, “Realizing an AI/ML Framework for Equipment Applications”

3:30 PM: Prakul Sharma, “Scalable Change Point Detection for Manufacturing Time Series: A Big Data Approach for Anomaly Detection” (with contributions from Prakul Sharma,  Tomonori Honda, Jeffrey D. David, Alex Fang, Edward Zhou,)

September 24: 

11:30 AM: Sanjana Gajendran, “Machine Learning Algorithms to address class imbalance and limited training data in semiconductor testing” (with contributions from Sanjana Gajendran, Tomonori Honda, Edward Zhou, Xinping Luo, Jeffrey D. David)

2:30 PM: Edward Zhou, “Machine Learning based Dynamic Testing” (with contributions from Edward Zhou, Tomonori Honda, Sanjana Gajendran, Jeffrey D David, Marc Jacobs, Rishi Bamb, AnTien (Lisa) Chen, Vaishnavi Reddipalli, Vishnu Rajan)

On September 22, from 8:00 AM – 12:00 PM, the Tutorials will be presented by PDF Solutions’s Alan Weber, Brian Rubow, and Jon Holt