Deep Dive: PDF Solutions & Siemens – Download

This presentation outlines the technical strategy for integrating Siemens’ Tessent Diagnosis with Exensio MA to create a unified solution for scan failure analysis. By transitioning scan diagnostics from a New Product Introduction (NPI) tool to a High Volume Manufacturing (HVM) ready solution, the Exensio unified platform eliminates fragmented workflows and enriches yield analytics with critical layout design information. The detailed overview explains how this integration enables product engineers to pinpoint exact failure locations with higher probability, optimize eProbe DirectScan recipes, and establish a closed-loop system from End-of-Line (EOL) testing to inline scan for accelerated yield ramp.

Download the full presentation to explore the technical architecture and key benefits of Exensio AIM Scan Analytics.