Yield Engineer Reports
Quickly save time and perform root cause analysis to improve product yields. Easily track production yields to identify issues and trends that can affect operating performance. Without the limitation of capacity, yield engineers can collect information that can identify long term yield trends over many products and operations. See a sample of the Exensio NPI module yield engineer analysis and reports below.
Parametric yield analysis
Wafer mapping, including parametric, bin, pass/fail, zonal, and site analysis
Inversion analysis, with low Cpk/high-yield and high Cpk, low-yield summaries
Normalization of all parameters to spec limits of +/-1 for WAT capability analysis
Statistical filtering of results
